Alan Allan, Intel Assignee to I300I
Study
of Integrated Measurement Impact on Cost-of-Ownership
Darren Dance, Wright, Williams and Kelly,
Peter Rosenthall, On-Line Technologies, Inc. and
Wim Aarts, Wacker
APC Experience
Jimmy Hosch,Verity Instruments
Motorola’s
View
Karen McBrayer, Motorola
SEMI Standard
for Low Pressure Particle Monitor Integration and Calibration
Claus Schneider, Fraunhofer-Institut
Overview of
SEMI Integrated Measurement Task Force
Claus Schneider, Fraunhofer-Institut
IMA Business
Model Presentation
Pat Gabella, SEMI,
Brad Van Eck, SEMATECH, and
Peter Solomon, On-Line Technologies, Inc.
Other Presentations
